By C. Barry Carter
This textual content is a significant other quantity to Transmission Electron Microscopy: A Textbook for fabrics Science through Williams and Carter. the purpose is to increase the dialogue of convinced issues which are both swiftly altering at the present or that might take advantage of extra precise dialogue than area allowed within the fundamental textual content. World-renowned researchers have contributed chapters of their specialty, and the editors have conscientiously ready those chapters to supply a uniform tone and remedy for this intriguing fabric. The publication gains an remarkable choice of colour figures showcasing the standard and diversity of chemical info that may be got from today’s tools, in addition to key pitfalls to prevent. As with the former TEM textual content, every one bankruptcy includes units of questions, one for self overview and a moment more desirable for homework assignments. in the course of the e-book, the fashion follows that of Williams & Carter even if the subject material turns into challenging—the goal is usually to make the subject comprehensible by means of first-year graduate scholars and others who're operating within the box of fabrics Science
Topics coated contain resources, in-situ experiments, electron diffraction, electronic Micrograph, waves and holography, focal-series reconstruction and direct equipment, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. the variety and intensity of fabric makes this significant other quantity crucial analyzing for the budding microscopist and a key reference for training researchers utilizing those and similar techniques.
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Extra info for Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry
3 Drift Correction and Beam Damage . . . . . . . 4 Conventional Data Analysis Methods . . . . . . . 4 Multivariate Statistical Analysis Methods . . . . . . . . 1 Principal Components Analysis (PCA) . . . . . . . 2 Factor Rotations . . . . . . . . . . . . . 3 Multivariate Curve Resolution (MCR) . . . . . . . 4 Quantification . . . . . . . . . . . . . . 5 Example of X-ray and Electron Energy-Loss Spectral Image Acquisition and Analysis .
436 16 X-ray and EELS Imaging . . . . . . . . . . . . . . . 1 What Are Spectral Images and Why Should We Collect Them? . 2 Some History . . . . . . . . . . . . . . . . . 3 Acquisition and Analysis of Spectral Images . . . . . . . 1 Sampling and the Effect of Probe Versus Pixel Size (STEMXEDS/EELS) or Magnification (EFTEM) . . . . . . . 2 Signal: Count Rate, Dwell Time, Spectral Image Size, and Acquisition Time . . . . . . . . . . . .
The reason is that once the third-order aberration (and nowadays sometimes even the fifth-order aberration) is corrected, the remaining aberrations depend on the settings of the corrector and the alignment of the beam. Often the latter are no longer rota tionally symmetric. 22λ/α; however, this is not the FW50 size, but the size of the first zero in the ring pattern. 02 alpha [rad] Fig. 2 Current in a Probe At very small currents, the size of the source image is negligible. 44) with Cc the chromatic aberration coefficient of the system and δU the FW50 of the energy distribution of the source.