Electron Backscatter Diffraction in Materials Science by Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P.

By Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field

Crystallographic texture or most popular orientation has lengthy been recognized to strongly impression fabric houses. traditionally, the technique of acquiring such texture facts has been even though using x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or electron channeling for neighborhood crystallographic info. in recent times, we've seen the emergence of a brand new characterization approach for probing the microtexture of fabrics. This develop has happen basically during the computerized indexing of electron backscatter diffraction (EBSD) styles. the 1st commercially to be had procedure used to be brought in 1994, and because then the expansion of revenues around the globe has been dramatic. This has followed widening applicability in fabrics technological know-how difficulties resembling microtexture, section id, grain boundary personality distribution, deformation microstructures, and so on. and is facts that this system can, occasionally, change extra time-consuming TEM or X-ray diffraction investigations. the aim of this ebook is to supply the basic foundation for EBSD. The formation and interpretation of EBSD styles and the gnomonic projection are defined because the framework for fabrics characterization utilizing EBSD. conventional illustration of texture in orientation area is mentioned when it comes to stereographic projections, pole figures, inverse pole figures, and orientation distribution services sooner than introducing the Rodrigues-Frank illustration of crystallographic texture. the basics of automatic EBSD and the accuracy of EBSD measurements are then mentioned. present and software program in addition to destiny customers for examining EBSD information units are reviewed. a short point out of the criterion required for the acquisition of an EBSD method is integrated as an reduction to this really new zone of fabrics characterization. The part concludes with chapters from 3 brands of EBSD gear that spotlight contemporary advances in services. The ebook concludes with a evaluation of modern functions of the strategy to remedy tricky difficulties in fabrics technological know-how in addition to demonstrates the usefulness of coupling EBSD with different techniques equivalent to numerical research, plasticity modeling, and TEM. awareness is paid to the dimension and mapping of pressure utilizing EBSD in addition to the characterization of deformed microstructures, non-stop recrystallization, research of aspects, ceramics, and superconducting fabrics.

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The spectra were recorded at a photon energy of 330 eV. After Ref. [171]. (e–f) Change in the IR transmission spectrum of a methylgrafted porous silicon layer upon successive annealing by increments of 50 °C from 50 °C to 550 °C (there is no measurable change up to ca. 400 °C; this is why not all of the spectra are shown). After Ref. [173].  [171]. Copyright 2007 by American Chemical Society. 6a) already starts to grow at 390 °C in the case of CH3, but is not observable in the case of CD3-terminated Si surfaces, indicating the superior performance in the case of CD3.

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